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Nanostructured Porous Silicon Films for Terahertz Optics
THz antireflection coating using nanostructured porous silicon nano-spiral films
Figure 1 (a) shows a scanning electron microscopy cross-sectional and top-down (inset at the bottom right) images of the 30 m thick Si spiral film, (b) shows the time-domain reflected signal for the 30 and 45 m thick samples, as well as the uncoated silicon references. The smaller first peak of the coated samples demonstrates the anti-reflection effect. The no sample reflection is from the sample holder which is an Aluminum reflector
Credits: Michael Riley
