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Transmission electron microscopy analysis

Research Achievements

Transmission electron microscopy analysis

Travis Wade visited the University of Melbourne in Australia to perform focused ion beam (FIB) extraction of a diamond field emitter tip in preparation for transmission electron microscopy (TEM) analysis. It is a challenging task to remove a 10 nanometer sharp feature from the substrate while preserving the integrity of its surface. Furthermore, the removed tip then has to be turned on its side and mounted onto a 3mm TEM grid. With the support of staff at the University of Melbourne and the sharing of new techniques, TEM samples were prepared and these nanoscale devices were analyzed for the first time. This work is continuing with the collaboration of the aberration-corrected electron microscope facility at Oak Ridge National Laboratory.